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fix(unity-test): Run unity tests in dedicated task

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Avoid running out of heap
This commit is contained in:
Slider0007
2023-12-28 21:32:43 +01:00
parent 9ced147d9c
commit 24c46c38b4
1 changed files with 57 additions and 26 deletions
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83
code/test/test_suite_flowcontroll.cpp
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@@ -1,10 +1,5 @@
#include <unity.h>
#include "components/jomjol-flowcontroll/test_flow_postrocess_helper.cpp"
#include "components/jomjol-flowcontroll/test_flowpostprocessing.cpp"
#include "components/jomjol-flowcontroll/test_flow_pp_negative.cpp"
#include "components/jomjol-flowcontroll/test_PointerEvalAnalogToDigitNew.cpp"
#include "components/jomjol-flowcontroll/test_getReadoutRawString.cpp"
// SD-Card ////////////////////
#include "nvs_flash.h"
#include "esp_vfs_fat.h"
@@ -15,6 +10,18 @@
#define __SD_USE_ONE_LINE_MODE__
#include "server_GPIO.h"
//*****************************************************************************
// Include files with functions to test
//*****************************************************************************
#include "components/jomjol-flowcontroll/test_flow_postrocess_helper.cpp"
#include "components/jomjol-flowcontroll/test_flowpostprocessing.cpp"
#include "components/jomjol-flowcontroll/test_flow_pp_negative.cpp"
#include "components/jomjol-flowcontroll/test_PointerEvalAnalogToDigitNew.cpp"
#include "components/jomjol-flowcontroll/test_getReadoutRawString.cpp"
#include "components/jomjol-flowcontroll/test_cnnflowcontroll.cpp"
bool Init_NVS_SDCard()
{
esp_err_t ret = nvs_flash_init();
@@ -81,7 +88,6 @@ bool Init_NVS_SDCard()
}
void initGPIO()
{
gpio_config_t io_conf;
@@ -96,31 +102,56 @@ void initGPIO()
}
/**
* @brief startup the test. Like a test-suite
* all test methods must be called here
*/
void task_UnityTesting(void *pvParameter)
{
UNITY_BEGIN();
RUN_TEST(test_getReadoutRawString);
printf("---------------------------------------------------------------------------\n");
RUN_TEST(test_ZeigerEval);
printf("---------------------------------------------------------------------------\n");
RUN_TEST(test_ZeigerEvalHybrid);
printf("---------------------------------------------------------------------------\n");
RUN_TEST(testNegative_Issues);
printf("---------------------------------------------------------------------------\n");
RUN_TEST(testNegative);
printf("---------------------------------------------------------------------------\n");
RUN_TEST(test_analogToDigit_Standard);
printf("---------------------------------------------------------------------------\n");
RUN_TEST(test_analogToDigit_Transition);
printf("---------------------------------------------------------------------------\n");
RUN_TEST(test_doFlowPP);
printf("---------------------------------------------------------------------------\n");
RUN_TEST(test_doFlowPP1);
printf("---------------------------------------------------------------------------\n");
RUN_TEST(test_doFlowPP2);
printf("---------------------------------------------------------------------------\n");
RUN_TEST(test_doFlowPP3);
printf("---------------------------------------------------------------------------\n");
RUN_TEST(test_doFlowPP4);
UNITY_END();
while(1);
}
/**
* @brief main task
*/
extern "C" void app_main()
{
initGPIO();
Init_NVS_SDCard();
esp_log_level_set("*", ESP_LOG_DEBUG); // set all components to ERROR level
initGPIO();
Init_NVS_SDCard();
esp_log_level_set("*", ESP_LOG_DEBUG); // set all components to DEBUG level
UNITY_BEGIN();
RUN_TEST(testNegative_Issues);
/* RUN_TEST(testNegative);
RUN_TEST(test_analogToDigit_Standard);
RUN_TEST(test_analogToDigit_Transition);
RUN_TEST(test_doFlowPP);
RUN_TEST(test_doFlowPP1);
RUN_TEST(test_doFlowPP2);
RUN_TEST(test_doFlowPP3);
RUN_TEST(test_doFlowPP4);
// getReadoutRawString test
RUN_TEST(test_getReadoutRawString);
*/
UNITY_END();
// Create dedicated testing task (heap size can be configured - large enough to handle a lot of testing cases)
// ********************************************
xTaskCreate(&task_UnityTesting, "task_UnityTesting", 12 * 1024, NULL, tskIDLE_PRIORITY+2, NULL);
}